If there is something you want to see in a non-destructive manner, please feel free to contact us.
Measurement of residual stress inside metals

Density distribution analysis without using neutrons

The highest resolution of 0.3mm in industrial X-ray CT device

Non-destructive test of 60cm-thickness concrete

Submicron X-ray microscope CT in development

Chemical status analysis using EXAFS spectroscopy

Terahertz radiation power surpasses that of large-scale synchrotrons

X-ray fluorescence for various elements

Measurement of particle size and membrane thickness using SAXS

Biomicroscopic X-ray CT in development

1 Please contact us by phone or email.
Please send us the analysis content, sample, delivery date, troubles with analysis, technical questions etc.
2 We will present proposal of analytical method and estimate.
3 Ordering and sample provision
4 Experiment and analysis
You can see the experiment.
5 We will send you a flash report by e-mail, fax etc.
6 After confirming the contents of the preliminary report, we will send the original together with the invoice and invoice.
7 Payment
Please pay by bank transfer.
If you wish, we will sign a confidentiality agreement.
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MIRRORCLE ANALYSIS CENTER, Ltd. 576-1 Anamura-cho, Kusatsu, Shiga 525-0012 JAPAN TEL: +81-77-584-5513 FAX: +81-77-584-5523 e-mail: bunseki@mirrorcle-analysis.co.jp |