XAFS
EXAFS can be used to analyze the chemical status
X-ray absorption fine structure (XAFS) can be used to investigate the structural status near specific atoms; it can be implemented in material analysis and other applications.
Two types of XAFS are considered: Extended XAFS (EXAFS) and Near-Edge XAFS (NEXAFS): EXAFS can obtain the radial distribution around specific atoms and provide the types and numbers of atoms.
It is a powerful tool for the analysis of storage batteries and for the development of catalysts. It is also suited for the analysis of environmental chemicals.
Analysis example : K-absorption edge measurement of molybdenum
Analysis example : Radial distribution function of potassium molybdate
| X-ray source | MIRRORCLE-CV4 |
| X-ray energy | 10〜25keV |
|
Atoms that can be analyzed |
K shell：Ga(31)〜In(49) L shell：Tl(81)〜U(92) |
| Energy resolution | ΔE / E = 5,000 |
| Sample form | Solid, thin film, liquid, powder |
| Sample thickness | Few μm〜tens of μm |
| Sample size | 10 x 30mm |